MicroLine

ML4240AM

This version of the ML4240 uses a back-illuminated sensor on deep depletion silicon with an enhanced multilayer coating, giving high quantum efficiency across the visible and into the near infrared. Deep depletion silicon has substantially higher dark current than standard silicon.

Sensor
sensor
e2v CCD42-40-1-S04
size (mm)
39.1 mm
Resolution
Resolution
2048 x 2048
Pixel Size
13.5 um
bit depth
16-bit
Full Well
100ke-
read noise
9e-
dark current
0.2 eps @ -30C
shutter
Mechanical
peak q.e.
96%
interface
USB 2
frame rate
data rate
500 kHz
Available Opions
Sensor Grade Selection
Liquid Cooling Adapters
Anti-Dew Technology
Camera Window Type

Quantum Efficiency

Quantum efficiency (QE) measures how effectively a detector converts incoming photons into electrons. In our graphs, QE is expressed as a percentage. A sensor’s QE typically varies based on its architecture, coatings, and materials. High QE remains a crucial consideration for applications such as astronomy, space debris imaging, and life science research.

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